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Maximizing the Information Content in Electron Microscopy Images
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S2 / November 2021
- Published online by Cambridge University Press:
- 03 December 2021, pp. 63-64
- Print publication:
- November 2021
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Reducing Electron Beam Damage with Multipass Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1794-1795
- Print publication:
- July 2017
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